LTA aims to expand its capabilities in the field of chemical surface analysis with the acquisition of new equipment that will benefit companies and researchers alike : a TOF-SIMS system and a XPS.
The recent technological breakthrough in the TOF-SIMS technics allows an ultimate chemical detection with a spatial resolution of one hundred nanometers on any kind of sample. Completed by the XPS, it becomes a real asset for the Research and Development of Western Switzerland region.
LTA invites you to discover a major technological advance in TOF-SIMS
Tuesday 20 June, 2017 at 2 pm
Grand auditoire, Ecole de physique 24, quai Ernest-Ansermet – Geneva
14.10 Project presentation
Professor Christoph Renner – LTA – UNIGE
14.15 Introduction to nano-sims
Dr Gregory L. Fisher – Physical Electronics, USA
15.30 Drinks and discussions